Opto Wafer Inspection Microscope

High-speed optical inspection is critical to identify irregularities, impurities, scratches, or contaminants on semiconductor wafers. Opto Imaging Modules offer a perfect solution for this task.

Key features:

Compact design makes them ideal for mobile use.

Image quality comparable to much more expensive products.

No moving parts and fully integrated illumination and imaging components ensure highest reproducibility.

Imaging Modules are precalibrated to eliminate user error.

 

View the  Opto Wafer Brochure.

 

Contact Microscope World for an Opto Wafer Inspection Microscope Quote.